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WAFERMAP 3.20 released WAFERMAP is an award winning software package used to collect, edit, analyze and visualize measured physical parameters on semiconductor wafers. WAFERMAP can import data files from various metrology tools. Revision History >> Download WAFERMAP 3.20 >> |
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PANELMAP 1.20 released It is a software package used to collect, edit, analyze and visualize measured physical parameters on rectangular semiconductor structures as LCD, TFT, solar or other panels. Revision History >> Download PANELMAP 1.20 >> |
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WAFERView.OCX 2.0 released It is a software development kit for metrology equipment manufacturers. It offers 9 different types of graphics of WAFERMAP for Windows as an ActiveX control. Revision History >> Download WAFERView.OCX 2.0 >> |
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Help us improve Send us information on the data file format of your metrology equipment and earn a US $ 100 Reward! More >> |
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