SE-MAP metrology software shipped to SOPRA

Manuela Boin Scientific Software started shipment of SE-MAP, an OEM version of WAFERMAP metrology software. The software will be used to collect, analyze and visualize measurements on SOPRA's metrology equipment. SE-MAP features configurable 1D-, 2D (contour)- and 3D plots, statistical analysis, SPC modules (trend charts, global statistics), a file browser and an editor for measured data. Plots can be printed outside the cleanroom in order to reduce the risk of particle generation. Several operations within one set of data or between different files can be carried out.

SOPRA is a french company founded in 1948 manufacturing highly-resourceful scientific instruments for more than twenty years. SOPRA is the leader in the field of high energy Excimer Lasers, Ultra-High Resolution Spectrometers and Spectroscopic Ellipsometers for both R&D and Production.

Manuela Boin Scientific Software has already licensed more than 90 versions of the DOS version of WAFERMAP to IC manufacturers, equipment vendors and wafer suppliers.

A shareware version of the program can be downloaded at http://home.t-online.de/home/manuela.boin

The new Windows 95 /NT version of WAFERMAP will be released soon. A number of companies has already expressed a strong interest in the product. Currently the beta version is under extensive testing at more than 30 customer sites mostly based in United States and Europe.

Contact:
Dr. Manuela Boin
E-Mail: manuela.boin@boin-gmbh.com
Tel: +49 (0) 7348-928233
Fax: +49 (0) 7348-928234
 

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