SE-MAP metrology software shipped to SOPRA
Manuela Boin Scientific Software started shipment of SE-MAP, an OEM version of
WAFERMAP metrology software. The software will be used to collect, analyze and
visualize measurements on SOPRA's metrology equipment. SE-MAP features
configurable 1D-, 2D (contour)- and 3D plots, statistical analysis, SPC modules
(trend charts, global statistics), a file browser and an editor for measured
data. Plots can be printed outside the cleanroom in order to reduce the risk of
particle generation. Several operations within one set of data or between
different files can be carried out.
SOPRA is a french company founded in 1948 manufacturing highly-resourceful
scientific instruments for more than twenty years. SOPRA is the leader in the
field of high energy Excimer Lasers, Ultra-High Resolution Spectrometers and
Spectroscopic Ellipsometers for both R&D and Production.
Manuela Boin Scientific Software has already licensed more than 90 versions of
the DOS version of WAFERMAP to IC manufacturers, equipment vendors and wafer
A shareware version of the program can be downloaded at
The new Windows 95 /NT version of WAFERMAP will be released soon. A number of
companies has already expressed a strong interest in the product. Currently the
beta version is under extensive testing at more than 30 customer sites mostly
based in United States and Europe.
Contact: Dr. Manuela Boin
Tel: +49 (0) 7348-928233
Fax: +49 (0) 7348-928234