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Semiconductor Equipment Manufacturers

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Semicon Taiwan 2009
September 30 -October 2, 2009, Taipei World Trade Center, Taiwan

Semicon Europa 2009
October 6-8, 2009, Messe Dresden Germany

PV Taiwan 2009
October 7-9 2009

Semicon Japan 2009
December 2 December 4, 2009, Makuhari Messe, Chiba, Japan

Semicon Russia 2010
June 14 -16, 2010, World Trade Center, Moscow, Russia

F&K Delvotec Bondtechnik GmbH
FEI Company
Fet Test Inc.
FHR Anlagenbau GmbH
Fico B.V.
Filmetrics Inc.
Finnish Specialglass OY
Fluoro Mechanic Co., Ltd.

Foothill Instruments

Adress: La Canada, CA 91011 USA
Phone: (+1) (818) 952-5600
Fax: (+1) (818) 952-5609

KV-300: Tabletop film thickness tool with vision for measuring transparent films of thickness range 20 nm to 500 m.
KT-22: Tabletop film thickness tool for measuring transparent films of thickness range 20 nm to 160 m.
KT-22m: Manual tabletop film thickness tool for measuring transparent films of thickness range 20 nm to 160 m.
Si-71: Tabletop metrology tool for measuring Si, GaAs, resist, ... of thickness range 10 m to 500+ m. Ideal for process control of backthinned Si, including bumped wafers.
Si-71m: Manual version of Si-71.
Inline: Above products are also available in component form to allow easy integration or clustering with other tools. Very compact design enables in-process metrology.

Four Dimensions
Frontier Semiconductor Measurements, Inc.
FSI International
Fujikin (Deutschland) GmbH
Futurestar Corporation

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Page created: October 1, 1997
Last modification: August 14, 2009

Copyright © 1997,98, 99, 2000, 01, 02, 03, 04, 05, 06, 07, 08, 09 by Boin GmbH - Metrology Software for the Semiconductor Industry. All rights reserved.
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