Semicon Taiwan 2009
September 30 -October 2, 2009, Taipei World Trade Center, Taiwan
Semicon Europa 2009
October 6-8, 2009, Messe Dresden Germany
PV Taiwan 2009
October 7-9 2009
Semicon Japan 2009
December 2 – December 4, 2009, Makuhari Messe, Chiba, Japan
Semicon Russia 2010
June 14 -16, 2010, World Trade Center, Moscow, Russia
F&K Delvotec Bondtechnik GmbH
Fet Test Inc.
FHR Anlagenbau GmbH
Finnish Specialglass OY
Fluoro Mechanic Co., Ltd.
Adress: La Canada, CA 91011 USA
Phone: (+1) (818) 952-5600
Fax: (+1) (818) 952-5609
KV-300: Tabletop film thickness tool with vision for measuring transparent films of thickness range 20 nm to 500 µm.
KT-22: Tabletop film thickness tool for measuring transparent films of thickness range 20 nm to 160 µm.
KT-22m: Manual tabletop film thickness tool for measuring transparent films of thickness range 20 nm to 160 µm.
Si-71: Tabletop metrology tool for measuring Si, GaAs, resist, ... of thickness range 10 µm to 500+ µm. Ideal for process control of backthinned Si, including bumped wafers.
Si-71m: Manual version of Si-71.
Inline: Above products are also available in component form to allow easy integration or clustering with other tools. Very compact design enables in-process metrology.
Frontier Semiconductor Measurements, Inc.
Fujikin (Deutschland) GmbH
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