WAFERMAP 3.60 released
WAFERMAP is an award winning software package used to collect, edit, analyze and visualize measured physical parameters on semiconductor wafers. WAFERMAP can import data files from various metrology tools.
PANELMAP 1.60 released
It is a software package used to collect, edit, analyze and visualize measured physical parameters on rectangular semiconductor structures as LCD, TFT, solar or other panels.
Application Notes 1-6 available
We would like to give you information on special applications, which are possible with the functionality of WAFERMAP and PANELMAP. Please choose "Application Notes" in "Products".