APPLICATION NOTES
We would like to give you information on special applications, which are possible with the functionality of WAFERMAP and PANELMAP.
Additionally, we would like to encourage you to let us know special applications you are doing with WAFERMAP and PANELMAP. In this case, we could publish a joint Application Note, if you are interested.
Also, in case you would like to use our products for a special application and are not sure how to do it, please contact us.
Application Note 1: Metrology Self Test- Application Note 2: Difference and Ratio of Wafer Maps
- Application Note 3: Editing Wafer Maps from Metrology Tools
- Application Note 4: Visualizing Tool "Fingerprints"
- Application Note 5: Temperature Mapping Using Multiple Thermocouples
- Application Note 6: Simulation of Wafer Rotation